The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Apr. 03, 2014
International Business Machines Corporation, Armonk, NY (US);
Howard M Hess, Winnetka, IL (US);
Rachel Tzoref-Brill, Haifa, IL;
Aviad Zlotnick, Mitzpeh Netofah, IL;
International Business Machines Corporation, Armon, NY (US);
Abstract
A computer-implemented method comprising: obtaining a description of a test suite which comprises a plurality of tests, wherein each test of the test suite is described by values of functional attributes, wherein at least a portion of the functional attributes are setup-related attributes, wherein a combination of values of the setup-relates attributes potentially indicate a setup activity to be performed prior to executing the test to set up a test environment for the test. Identifying, based on the description of the test suite, a setup activity that is associated with two or more tests, wherein the setup activity is configured to set up a component of the test environment, wherein the identifying is performed by a processor. Providing a first instruction to perform the setup activity prior to executing a first test of the two or more tests. And, providing a second instruction to reuse the component of the test environment when executing additional tests of the two or more tests, whereby avoiding performing duplicate setup activities.