The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Aug. 29, 2008
Paul Kingston Duffie, Palo Alto, CA (US);
Andrew Thomas Waddell, Portola Valley, CA (US);
Adam James Bovill, San Francisco, CA (US);
Yujie Lin, Sunnyvale, CA (US);
Pawan Singh, Sunnyvale, CA (US);
Paul Kingston Duffie, Palo Alto, CA (US);
Andrew Thomas Waddell, Portola Valley, CA (US);
Adam James Bovill, San Francisco, CA (US);
Yujie Lin, Sunnyvale, CA (US);
Pawan Singh, Sunnyvale, CA (US);
Spirent Communications, Inc., Sunnyvale, CA (US);
Abstract
A response map descriptively modeling the textual format of a test response of a system verification test is created without a priori understanding of the format of the given response. Such response map is applied to the test response or other similar test responses that share the same format. More specifically, a method of identifying and extracting one or more formats of textual data included in test responses from system verification testing of a system under test is provided, by receiving a first test response including first textual data in one or more formats, generating a response map descriptively modeling the first test response without a priori information of the one or more formats, and applying the response map to a second test response to identify and extract second textual data from the second test response. The second textual data is also in the one or more formats.