The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

Aug. 07, 2013
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventors:

Adam Douglas Morley, Seattle, WA (US);

Barry Bailey Hunter, Jr., Sammamish, WA (US);

Yijun Lu, Kenmore, WA (US);

Timothy Andrew Rath, Seattle, WA (US);

Kiran-Kumar Muniswamy-Reddy, Seattle, WA (US);

Xianglong Huang, Bellevue, WA (US);

Jiandan Zheng, Bellevue, WA (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/20 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2002 (2013.01); G06F 11/0709 (2013.01); G06F 11/079 (2013.01); G06F 11/0787 (2013.01); G06F 11/0793 (2013.01);
Abstract

An automated system may be employed to perform detection, analysis and recovery from faults occurring in a distributed computing system. Faults may be recorded in a metadata store for verification and analysis by an automated fault management process. Diagnostic procedures may confirm detected faults. The automated fault management process may perform recovery workflows involving operations such as rebooting faulting devices and excommunicating unrecoverable computing nodes from affected clusters.


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