The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Dec. 31, 2012
Emc Corporation, Hopkinton, MA (US);
Chenhui Fan, Shanghai, CN;
Ziye Yang, Shanghai, CN;
Lintao Wan, Shanghai, CN;
Xi Chen, Shanghai, CN;
David Black, Acton, MA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
Techniques for delivering and measuring storage quality-of-service to virtual machines in a distributed virtual infrastructure. In one example, a method comprises the following steps. A controller obtains quality-of-service data from at least a portion of components of a distributed virtual infrastructure, wherein the components of the distributed virtual infrastructure comprise one or more storage units, one or more processing units, and one or more switches operatively coupled to form the distributed virtual infrastructure. The controller manages at least one input/output request throughout a path defined by at least one of the one or more processing units, at least one of the one or more switches, and at least one of the one or more storage units, based on at least a portion of the collected quality-of-service data.