The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Nov. 30, 2012
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Kang Wang, Madison, WI (US);
Peng Lai, Foster City, CA (US);
James Hartman Holmes, Madison, WI (US);
Frank R. Korosec, Middleton, WI (US);
Assignee:
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/561 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G01R 33/561 (2013.01); G01R 33/4824 (2013.01);
Abstract
A magnetic resonance imaging data sampling method includes randomly undersampling a first half of a k-space plane such that a plurality of points in the first half are sampled points and the remaining plurality of points in the first half are unsampled points. The method also includes determining, for each sampled point in the first half, a corresponding point in a second half of the k-space plane that corresponds to the point-wise complex conjugate location of the sampled point.