The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Nov. 28, 2014
Applicant:
SK Hynix Inc., Gyeonggi-do, KR;
Inventors:
Kie-Bong Ku, Gyeonggi-do, KR;
Lee-Bum Lee, Gyeonggi-do, KR;
Assignee:
SK Hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G11C 29/08 (2006.01); G11C 29/44 (2006.01); G11C 29/50 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/26 (2013.01); G01R 31/2834 (2013.01); G11C 29/08 (2013.01); G11C 29/44 (2013.01); G11C 29/50 (2013.01);
Abstract
A method for testing a semiconductor device includes testing the semiconductor device in a plurality of operation modes sequentially, and programming the semiconductor device to operate in at least one of the operation modes when the semiconductor device passes the testing.