The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
May. 18, 2012
Applicant:
Shun Momose, Kyoto, JP;
Inventor:
Shun Momose, Kyoto, JP;
Assignee:
Rohm Co., Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 21/03 (2006.01); G01N 21/07 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54386 (2013.01); G01N 21/03 (2013.01); G01N 21/07 (2013.01); G01N 2021/0325 (2013.01); G01N 2021/0346 (2013.01); G01N 2333/11 (2013.01);
Abstract
A microchip to be used for measuring a plurality of types of objects to be measured. The microchip includes at least a reagent retaining portion and a detecting portion. The test reagent retaining portion includes a plurality of types of test reagents corresponding respectively to the plurality of types of objects to be measured. A plurality of time courses for a change in detected value at the detecting portion caused by a reaction between the test reagents and the objects to be measured corresponding respectively thereto are all different from each other.