The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Apr. 19, 2013
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Juergen Schneider, Sinsheim, DE;
Bernd Widzgowski, Dossenheim, DE;
Jochen Sieber, Mannheim, DE;
Wernher Fouquet, Mannheim, DE;
Lars Friedrich, Mannheim, DE;
Arnold Giske, Heidelberg, DE;
Lioba Kuschel, Mannheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
The invention relates to a method for investigating a sample with regard to the lifetime of an excited state, in particular a fluorescence lifetime, and/or with regard to a property of a sample which is correlated with a lifetime of an excited state, in particular with a fluorescence lifetime, a sample region being illuminated with a sequence of excitation light pulses. The method is characterized in that the light quantity and/or number of photons of the detected light, in particular fluorescent light, proceeding from the sample region is measured temporally between the excitation light pulses exclusively within a detection time window in each case, at least two detection time windows having different temporal lengths.