The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Apr. 04, 2014
Applicant:
Aircelle, Gonfreville L'Orcher, FR;
Inventors:
Lionel Gay, Le Havre, FR;
Thibaud Chopard, Epouville, FR;
Odile Lefeu, La Remuee, FR;
Frédéric Joubert, Le Havre, FR;
Assignee:
AIRCELLE, Gonfreville l'Orcher, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/3563 (2014.01); G01J 3/45 (2006.01); G01N 21/95 (2006.01); G01N 29/04 (2006.01); G01N 29/12 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01J 3/45 (2013.01); G01N 21/3563 (2013.01); G01N 21/95 (2013.01); G01N 29/041 (2013.01); G01N 29/12 (2013.01); G01N 2021/3595 (2013.01); G01N 2021/8472 (2013.01); G01N 2201/0221 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/2694 (2013.01);
Abstract
A method for the non-destructive inspection of a part made from an organic-matrix composite material (CMO) includes the steps of: a) carrying out a surface inspection of the part by Fourier transform infrared spectroscopy (FTIS), b) if step a) reveals a defect, carrying out in-depth inspections of the organic-matrix composite material according to two complementary ultrasound techniques.