The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Nov. 29, 2012
Applicant:
Corning Incorporated, Corning, NY (US);
Inventor:
Cameron John Tovey, Painted Post, NY (US);
Assignee:
Corning Incorporated, Corning, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 9/00 (2006.01); G01J 3/433 (2006.01); G01N 21/77 (2006.01); H04N 5/235 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/28 (2013.01); G01J 3/4338 (2013.01); G01J 9/00 (2013.01); G01N 21/7743 (2013.01); H04N 5/2354 (2013.01); G01J 2003/1243 (2013.01);
Abstract
A tunable light source system with wavelength measurement capability for a hyper-spectral imaging system is disclosed. A method includes reference filtering a portion of a tunable light beam while tuning the center wavelength, detecting with at least one photodetector the reference-filtered tunable light beam and generating therefrom at least one detector signal that varies with the center wavelength, and determining a tunable center wavelength based on the at least one detector signal.