The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Mar. 05, 2014
Applicant:
Kabushiki Kaisha Topcon, Itabashi-ku, Tokyo-to, JP;
Inventors:
Kaoru Kumagai, Tokyo-to, JP;
Jun-ichi Kodaira, Tokyo-to, JP;
Assignee:
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01);
U.S. Cl.
CPC ...
G01C 15/002 (2013.01); G01C 15/00 (2013.01); G01C 15/008 (2013.01);
Abstract
The invention provides a surveying instrument () which has a measuring unit comprises an operation control panel () rotatably mounted on the measuring unit with vertical axis as the center with respect to the measuring unit, and a relative angle detecting means for detecting a relative angle of the operation control panel and the measuring unit, wherein the operation control panel is so arranged that a command is issued to relatively rotate the measuring unit based on the relative angle detected by the relative angle detecting means.