The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

May. 14, 2010
Applicants:

Thomas Charles Robbins, Salt Lake City, UT (US);

Robert Andrew Palais, Salt Lake City, UT (US);

Carl Thomas Wittwer, Salt Lake City, UT (US);

Inventors:

Thomas Charles Robbins, Salt Lake City, UT (US);

Robert Andrew Palais, Salt Lake City, UT (US);

Carl Thomas Wittwer, Salt Lake City, UT (US);

Assignee:

BIOFIRE DIAGNOSTICS, INC., Salt Lake City, UT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/28 (2006.01); G01N 1/31 (2006.01); G06F 3/01 (2006.01); G06F 3/042 (2006.01); C12Q 1/68 (2006.01); G06F 19/24 (2011.01); G06F 19/20 (2011.01);
U.S. Cl.
CPC ...
C12Q 1/6816 (2013.01); G06F 19/24 (2013.01); G06F 19/20 (2013.01);
Abstract

An experimental melting curve is modeled as a sum of a true melting curve and background fluorescence. A deviation function may be generated based upon the experimental melting curve data and a model of a background signal. The deviation function may be generated by segmenting a range of the experimental curve into a plurality of windows. Within each window, a fit between the model of the background signal and the experimental melting curve data may be calculated. The deviation function may be formed from the resulting fit parameters. The deviation function may include background signal compensation and, as such, may be used in various melting curve analysis operations, such as data visualization, clustering, genotyping, scanning, negative sample removal, and the like. The deviation function may be used to seed an automated background correction process. A background-corrected melting curve may be further processed to remove an aggregation signal.


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