The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

Mar. 15, 2013
Applicant:

Toppan Printing Co., Ltd., Tokyo, JP;

Inventors:

Kazuhiro Yashiki, Tokyo, JP;

Chikara Sawamura, Tokyo, JP;

Koji Umezaki, Tokyo, JP;

Akira Kubo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29D 11/00 (2006.01); B05D 5/06 (2006.01); G02B 5/18 (2006.01); G02B 5/32 (2006.01); B42D 25/29 (2014.01); B42D 25/324 (2014.01); B42D 25/328 (2014.01);
U.S. Cl.
CPC ...
B05D 5/063 (2013.01); B42D 25/29 (2014.10); G02B 5/1842 (2013.01); G02B 5/32 (2013.01); B42D 25/324 (2014.10); B42D 25/328 (2014.10); B42D 2033/18 (2013.01); B42D 2033/24 (2013.01); Y10T 428/24612 (2015.01);
Abstract

A method of manufacturing an optical device that includes a relief structure formation layer, a first layer made of a first material having a refractive index different from that of a material of the relief structure formation layer, and a second layer made of a second material different from the first material and covering the first layer. A ratio of an amount of the second material at a position of the second region to an apparatus area of the second region is zero or smaller than a ratio of an amount of the second material at the position of the second sub-region to an apparatus area of the second sub region.


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