The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Aug. 20, 2013
Frank Dennerlein, Forchheim, DE;
Mathias Hoernig, Erlangen, DE;
Frank Dennerlein, Forchheim, DE;
Mathias Hoernig, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method and x-ray device to determine a three-dimensional target image data set showing at least one partial region of interest of an acquisition region, wherein the image data of the three-dimensional target image data set are reconstructed from two-dimensional projection images acquired from various projection directions, first projection images are acquired without a collimation of the radiation source from first projection directions and a three-dimensional overview image data set of the acquisition region is reconstructed from the first projection images. The partial region of interest is selected in the overview image data set. Second projection images are acquired, with collimation at the partial region, from second projection directions, the second projection directions differing from the first projection directions. The target image data set showing the acquisition region and the partial region of interest is reconstructed from all first and second projection images.