The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Dec. 10, 2013
Joe S. Wakil, Houston, TX (US);
Paul Van Saarloos, Balcatta, AU;
Vasyl Molebny, Kiev, UA;
Sergiy Molebny, Kiev, UA;
Joe S. Wakil, Houston, TX (US);
Paul van Saarloos, Balcatta, AU;
Vasyl Molebny, Kiev, UA;
Sergiy Molebny, Kiev, UA;
Other;
Abstract
Provided are methods for determining an axis of best vision of an eye or for objectively determining a visual axis of an eye and for making the most accurate measurement of refraction. Generally, an optical measuring device or instrument projects laser beams into the eye during a scan. Positions of the projected beams are detected and measured on the retina to produce a set of projections. Wave front tilt of radiation that is backscattered from the retina is calculated as a best fit from the set of projections. The axis of best vision or the visual axis is reconstructed from a set of those traces of chief rays exiting from the eye that cross the nodal point of the optical system of the eye and that are normal to the wave front tilts. Measuring with the Styles Crawford scans centered over this axis provides the most accurate objective refraction.