The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Oct. 24, 2012
Applicant:

Tekelec, Inc., Morrisville, NC (US);

Inventors:

Seetharaman Khadri, Cary, NC (US);

Srikanth Nanjund Rao, Cary, NC (US);

Peter J. Marsico, Chapel Hill, NC (US);

Assignee:

Tekelec, Inc., Morrisville, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/24 (2006.01); H04W 24/00 (2009.01); H04L 12/26 (2006.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04W 24/00 (2013.01); H04L 43/10 (2013.01); H04L 43/12 (2013.01); H04L 43/50 (2013.01); H04L 63/0892 (2013.01); H04L 63/20 (2013.01);
Abstract

According to one aspect, the subject matter described herein includes a method for testing a Diameter routing node. The method occurs a Diameter routing node. The method includes receiving, from a Diameter message generation module and via a test connection, a first Diameter message. The method also includes modifying the first Diameter message to include a test indicator parameter indicating the first Diameter message is a test message. The method further includes processing the first Diameter message. The method also includes directing the first Diameter message to an egress message manager.


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