The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Aug. 08, 2014
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Daisuke Suzuki, Tokyo, JP;

Koichi Yamashita, Tokyo, JP;

Narihiro Matoba, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/335 (2011.01); H04N 9/04 (2006.01);
U.S. Cl.
CPC ...
H04N 9/045 (2013.01);
Abstract

An imaging device has an intra-plane pixel summation unit and an inter-plane pixel summation unit. In the frame of interest, the intra-plane pixel summation unit sums the signals of the pixel of interest and selected highly correlated neighboring pixels to generate an intra-plane sensitized signal and a code indicating the pattern formed by the pixel of interest and the selected pixels. The inter-plane pixel summation unit selects pixels for summation from among the pixels positioned identically to the pixel of interest and pixels in the neighborhood of the identically positioned pixels in one or more frames neighboring the frame of interest on the basis of the agreement or disagreement of their pixel summing pattern codes and correlation of their intra-plane sensitized signals. In a Bayer array imaging device, enhanced sensitivity is obtained without causing color mixing.


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