The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Feb. 21, 2011
Applicants:

Keiro Muro, Koganei, JP;

Sadaki Nakano, Kokubunji, JP;

Inventors:

Keiro Muro, Koganei, JP;

Sadaki Nakano, Kokubunji, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06Q 10/06 (2012.01); H04L 29/08 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
H04L 29/06891 (2013.01); G05B 23/0237 (2013.01); G06Q 10/06 (2013.01); H04L 67/12 (2013.01);
Abstract

Disclosed is a computer system provided with a plurality of sensors provided in a plurality of devices to observe a predetermined amount, and a server for examining the physical amount transmitted from the sensors, wherein the plurality of devices are classified into a first device group and a plurality of second device groups, a plurality of second examination rules indicating the examination methods of the physical amount are set in the plurality of second device groups, the server calculates the similarity between the first device group and each of the second device groups, and, on the basis of the calculated similarity, a first examination rule to be set in the first device group is extracted from the plurality of second examination rules set in the plurality of second device groups.


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