The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2016
Filed:
Jan. 13, 2014
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Jeng-Yuan Yang, Garland, TX (US);
Youichi Akasaka, Allen, TX (US);
Motoyoshi Sekiya, Richardson, TX (US);
Takuji Maeda, Kawasaki, JP;
Hiroki Ooi, Kawasaki, JP;
Kentaro Nakamura, Tokyo, JP;
Satoru Okano, Yokohama, JP;
Fujitsu Limited, Kawasaki-shi, JP;
Abstract
The present disclosure includes a computer-implemented method of correcting a measured optical signal-to-noise ratio (OSNR) comprising receiving an optical signal and measuring OSNR of the optical signal using an interferometric OSNR monitor device. The method also includes applying a correction table to the measured OSNR to generate a corrected OSNR using a controller, the correction table comprising a correction function to counteract an artifact in the measured OSNR. The method also includes storing the corrected OSNR in a non-transitory computer-readable medium. The present disclosure also includes associated devices applying the correction table and methods of generating the correction table.