The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Nov. 29, 2013
Applicant:

Electricite DE France, Paris, FR;

Inventors:

Bastien Cousin, Villeurbanne, FR;

Gilles Deleuze, Paris, FR;

Laurent Cretinon, Poleymieux-au-Mont-d'or, FR;

Gutemberg Goncalves Dos Santos, Jr., Paris, FR;

Lirida Naviner, Le Blanc Mesnil, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
H03K 19/0033 (2013.01); H03K 19/00392 (2013.01);
Abstract

The method relates to a method for the radiation hardening of an electronic circuit by partitioning, said circuit including an odd number K of parallel branches connected to a same primary input I and each including a same series of N modules and N−1 nodes linking two consecutive modules, the K branches together forming a series of N−1 gates respectively consisting of parallel K nodes, and a primary arbiter forming a majority vote from the output signal of the K branches, the method being characterized in that it includes the following steps which are repeated for each one of the gates: determining a reliability of a subcircuit upstream from the gate consisting of the portions of the K branches located between the primary input and the gate, and the insertion of at least one arbiter at the gate forming a majority vote from the output signals of said portions of branches constituting the scanned subcircuit and outputting at least one majority signal to the respective inputs of an additional subcircuit formed by the branch portions downstream from the gate, if the reliability of the scanned subcircuit is less than a reliability set point.


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