The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2016
Filed:
Sep. 30, 2011
Tohru Shiohama, Kyoto, JP;
Tohru Shiohama, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A method for selecting product ions at the time of performing multiple reaction monitoring (MRM) using an MS/MS type mass spectrometer is provided. Plurality of product ion scan events is prepared for certain precursor ions. In the product ion scan events, parameters for determining the cleavage conditions of the precursor ions are changed. Next, the precursor ions are introduced into a collision cell and the plurality of product ion scan events is executed, thereby obtaining a plurality of mass spectra corresponding to the respective product ion scan events. Then, the plurality of mass spectra is compared with one another, and ions corresponding to the mass peak with the highest appearance frequency are selected as product ions. Alternatively, ions having the highest cumulative signal intensity obtained by integrating the plurality of mass spectra are selected as product ions. Accordingly, optimum product ions for certain precursor ions are selected.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile