The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Mar. 15, 2010
Applicants:

Ewald Roessl, Ellerau, DE;

Thomas Koehler, Norderstedt, DE;

Gerhard Martens, Henstedt-Ulzburg, DE;

Inventors:

Ewald Roessl, Ellerau, DE;

Thomas Koehler, Norderstedt, DE;

Gerhard Martens, Henstedt-Ulzburg, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G21K 7/00 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G21K 7/00 (2013.01); A61B 6/4291 (2013.01); A61B 6/484 (2013.01); A61B 6/502 (2013.01);
Abstract

An X-ray differential phase-contrast imaging system has three circular gratings. The circular gratings are aligned with the optical axis of the radiation beam and a phase stepping is performed along the optical axis with the focal spot, the phase grating and/or the absorber grating. The signal measured is the phase-gradient in radial direction away from the optical axis.


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