The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Aug. 05, 2013
Applicant:

Gabriele Suft, Nürnberg, DE;

Inventor:

Gabriele Suft, Nürnberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/06 (2006.01); G21K 1/06 (2006.01); G21K 1/02 (2006.01);
U.S. Cl.
CPC ...
G21K 1/06 (2013.01); G21K 1/02 (2013.01); G21K 2207/005 (2013.01); H01J 2235/068 (2013.01);
Abstract

An arrangement for inverse x-ray phase contrast imaging includes a photon-counting x-ray detector and a multibeam x-ray tube. Focal points of the x-ray tube are collimated such that a narrow x-ray beam that is directed toward an optical axis of the arrangement and toward the x-ray detector may be generated. An active surface of the x-ray detector is at least as large as a cross-sectional surface of the narrow x-ray beam. The arrangement also includes a source grating arranged between the x-ray tube and the x-ray detector. The arrangement includes a defraction grating arranged between the source grating and the x-ray detector, and an absorption grating arranged between the defraction grating and the x-ray detector.


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