The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Aug. 22, 2013
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Yeong Woong Yu, Busan, KR;

Hong Suk Hu, Daejeon, KR;

Hea Won Lee, Daejeon, KR;

Yong Hoon Choi, Daejeon, KR;

Hoon Jung, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G09B 29/10 (2006.01);
U.S. Cl.
CPC ...
G09B 29/106 (2013.01);
Abstract

Disclosed are a geographic information analyzing apparatus and a method thereof, and more specifically, a geographic information analyzing apparatus which is capable of analyzing a region arbitrarily set by a user and a method thereof. The a geographic information analyzing apparatus disclosed in this specification includes a data storing unit which includes a spatial data storing unit which stores geospatial information and an attribute data storing unit which stores attribute information corresponding to the spatial data; a map viewer which provides a user interface and receives spatial information of an arbitrary region from a user, and a function providing unit which compares the geospatial information with the spatial information of the arbitrary region to calculate an overlapping ratio and performs analysis in accordance with a previously set function using attribute information in accordance with the overlapping ratio.


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