The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Aug. 25, 2014
Applicants:

Ian S. Robinson, Redondo Beach, CA (US);

Bradley A. Flanders, Whittier, CA (US);

Anthony M. Sommese, Northport, NY (US);

Inventors:

Ian S. Robinson, Redondo Beach, CA (US);

Bradley A. Flanders, Whittier, CA (US);

Anthony M. Sommese, Northport, NY (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/40 (2006.01);
U.S. Cl.
CPC ...
G06T 7/408 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10024 (2013.01);
Abstract

A rapid anomaly detection approach with corresponding method and system to detect anomalies in scene pixels making up a hyperspectral scene, efficiently, is presented. The approach includes tailoring an approximation of an anomaly score for each scene pixel, individually, based on an 'intermediate anomaly score.' The intermediate score is computed using a portion of the terms used to compute the anomaly score. Scene pixels with low intermediate anomaly scores are removed from further processing. The remaining scene pixels are further processed, including computing anomaly scores to detect anomalies in these pixels. Advantageously, examples of the RAND approach process a few terms of all scene pixels, eliminate most scene pixels, and calculate more terms on high anomaly scoring scene pixels as needed.


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