The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2016
Filed:
Aug. 29, 2012
Applicants:
Yoshihisa Minato, Kyoto, JP;
Yukiko Yanagawa, Nara, JP;
Inventors:
Yoshihisa Minato, Kyoto, JP;
Yukiko Yanagawa, Nara, JP;
Assignee:
OMRON Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 21/8806 (2013.01); G06T 7/001 (2013.01); G06T 7/0081 (2013.01); G06T 7/0083 (2013.01); G06T 7/0087 (2013.01); G06T 7/0097 (2013.01); G06T 2200/24 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/20144 (2013.01); G06T 2207/30164 (2013.01);
Abstract
An inspection area setting method for setting inspection area-defining information defining an inspection area to an image inspecting device, the image inspecting device being configured to extract a portion constituting the inspection area as an inspection area image from an original image obtained by taking an image of an inspection object, and to inspect the inspection object by analyzing the inspection area image, includes an acquisition step of acquiring a sample image obtained by taking an image of a sample of the inspection object, an inspection area searching step, and a setting step.