The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Jun. 23, 2011
Applicants:

Ryohei Fujimaki, Tokyo, JP;

Satoshi Morinaga, Tokyo, JP;

Inventors:

Ryohei Fujimaki, Tokyo, JP;

Satoshi Morinaga, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06Q 50/22 (2012.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
G06Q 50/22 (2013.01); G06F 17/30312 (2013.01); G06Q 10/00 (2013.01);
Abstract

An abnormality score calculating means calculates abnormality scores which are information indicating abnormality of medical data, based on specificity of the medical data. An abnormality score vector generating means creates at least one or more abnormality score vectors which are information obtained by integrating the abnormality scores. Further, a side effect detecting means which decides a likelihood of a side effect indicated by the abnormality score vector, based on a predetermined rule, and detects an abnormality score vector the likelihood of which is set in advance and which satisfies conditions as information indicating the side effect.


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