The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Mar. 26, 2013
Applicant:

Synaptics Incorporated, San Jose, CA (US);

Inventors:

Anthony P. Russo, New York, NY (US);

Larry E. Hattery, Beaverton, OR (US);

Rohini Krishnapura, Sunnyvale, CA (US);

Philip Yiu Kwong Chan, Fremont, CA (US);

Assignee:

Synaptics Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00087 (2013.01); G06K 9/00926 (2013.01);
Abstract

A system and method is disclosed for comparing biometric image data to a stored enrollment template that may comprise collecting a set of biometric image data for a biometric object image from a biometric object imaging sensor; storing the biometric object image data in a memory as an enrollment template for further comparison to find a match with subsequently imaged biometric object image data; collecting a subsequent set of biometric image data for a biometric object image from the biometric object imaging sensor; updating the enrollment template; determining if a limited enrollment window remains open; and repeating the collecting of a subsequent set of biometric data step if the enrollment window remains open. Determining if the enrollment window remains open may be by determining the existence of one of a stability indicator and an instability indicator.


Find Patent Forward Citations

Loading…