The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Jun. 25, 2010
Applicants:

Yuichi Hamada, Kobe, JP;

Masaharu Shibata, Kobe, JP;

Daigo Fukuma, Kobe, JP;

Inventors:

Yuichi Hamada, Kobe, JP;

Masaharu Shibata, Kobe, JP;

Daigo Fukuma, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/40 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
G06F 19/366 (2013.01);
Abstract

A sample testing apparatus comprising: a first storing section for storing identification information of an operator in association with first or second attribute information; an identification information receiving section for receiving an input of the identification information of the operator; a testing section for obtaining a test result by testing a sample; a second storing section for storing the test result of the sample so as to be linked with the received identification information; an operation end instruction receiving section for receiving an operation end instruction by the operator; and a deleting section for deleting from the second storing section the test result which is stored so as to be linked with the identification information received by the identification information receiving section in the case in which the received identification information is associated with the second attribute information when the operation end instruction is received.


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