The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2016
Filed:
Jan. 17, 2012
Ghassan G. Salloum, Seattle, WA (US);
Benjamin T. Grover, Issaquah, WA (US);
Ghassan G. Salloum, Seattle, WA (US);
Benjamin T. Grover, Issaquah, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Techniques for application quality testing time predictions are described that provide customized processing time predictions for application testing. Testing times for various stages of testing are collected during application testing. The collected testing data may be stored in association with various attribute values ascertained for the applications. The collected timing data is used to predict processing times for applications that match defined profiles. The profiles may be defined to include selected attributes and values used to identify applications having corresponding attributes and values. The collected timing data may be processed to derive predictions for processing times on a profile-by-profile basis. When a new application is submitted, the application is matched to a particular profile based on attribute values possessed by the application. Then, processing time predictions associated with the matching profile may be obtained, assigned to the application, and output for presentation to a developer of the application.