The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Dec. 20, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Robert P. Foley, Clinton, MA (US);

Ronald D. Proulx, Boxborough, MA (US);

Marc C. Cassano, Medway, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1084 (2013.01);
Abstract

A method, computer program product, and computing system for sensing the occurrence of an uncorrectable condition within a data stripe of a RAID array. The data strip includes a plurality of data portions and a parity portion. One or more invalid data portions included within the plurality of data portions are identified. The one or more invalid data portions are populated with filler data having a known pattern, thus defining one or more filler portions. The parity portion is updated based, at least in part, upon the one or more filler portions, thus defining an updated data stripe that includes an updated parity portion.


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