The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Jun. 27, 2012
Applicant:

Thomas William Dey, Springwater, NY (US);

Inventor:

Thomas William Dey, Springwater, NY (US);

Assignee:

Exelis, Inc., Herndon, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 21/00 (2006.01);
U.S. Cl.
CPC ...
G03B 21/00 (2013.01);
Abstract

A generator and projector system for providing a test target for testing sensing apparatus includes an aperture stop located adjacent to the sensing apparatus. Also included are a spherical mirror having a concave side facing the aperture stop and an object disposed between the spherical mirror and the aperture stop. The object includes various test targets for testing the sensing apparatus. A longitudinal optical axis passes through the aperture stop, the spherical mirror and the object. Illumination of the object generates the test target, which is then reflected from the spherical mirror toward the aperture stop, for testing the sensing apparatus.


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