The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Jun. 13, 2014
Applicant:

Princeton Optronics Inc., Mercerville, NJ (US);

Inventors:

Chuni Lal Ghosh, West Windsor, NJ (US);

Jean Francois Seurin, Princeton Junction, NJ (US);

Laurence S Watkins, Pennington, NJ (US);

Assignee:

PRINCETON OPTRONICS INC., Mergerville, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/481 (2006.01); G01S 17/89 (2006.01); G01S 17/02 (2006.01); G01S 7/484 (2006.01); H01S 5/42 (2006.01); H01S 5/00 (2006.01); H01S 5/022 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4815 (2013.01); G01S 7/484 (2013.01); G01S 17/026 (2013.01); G01S 17/89 (2013.01); H01S 5/005 (2013.01); H01S 5/02248 (2013.01); H01S 5/423 (2013.01); G01S 7/4816 (2013.01);
Abstract

An apparatus and a method are provided for 3-D imaging and scanning using a 2-D planar VCSELs source configured as a lightfiled optical source. VCSELs are configured in different 2-D spatial arrangements including single VCSEL, or preferably a group, cluster, or array each to be operated effectively as an independent VCSEL array source. A set of microlens and an imaging lens positioned at a pre-determined distance collimates radiation from each VCSEL array source to a set of parallel beams. The parallel beams from different VCSEL array sources generated in a rapid pre-determined timing sequence provide scanning beams to illuminate an object. The radiation reflected from the object is analyzed for arrival time, pulse shape, and intensity to determine a comprehensive set of distance and intensity profile of the object to compute a 3-D image.


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