The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Feb. 13, 2013
Applicants:

Gregory Huntindgon Griffin, Toronto, CA;

Kevan Anderson, Oshawa, CA;

Graham Wright, Toronto, CA;

Inventors:

Gregory Huntindgon Griffin, Toronto, CA;

Kevan Anderson, Oshawa, CA;

Graham Wright, Toronto, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/48 (2006.01); G01R 33/28 (2006.01);
U.S. Cl.
CPC ...
G01R 33/48 (2013.01); G01R 33/288 (2013.01);
Abstract

A method for automatically measuring currents induced on conducting structures positioned in the bore of a magnetic resonance imaging ('MRI') scanner using a single magnetic resonance image is provided. A conductive structure is positioned within the bore of the MRI scanner during imaging. When the MRI system is transmitting an RF field, a current is induced in the conductive structure. The current creates a magnetic field at the Larmor frequency, which couples to the RF magnetic field in the vicinity of the conductive structure. The modified magnetic field results in an artifact being generated in phase images. The artifact in the phase image is then analyzed to determine the current induced in the conductive structure.


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