The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Oct. 07, 2011
Applicants:

Philippe Garreau, Paris, FR;

Luc Duchesne, Angervilliers, FR;

Raphaël Laporte, Bois Colombes, FR;

Ludovic Durand, Marcoussis, FR;

Inventors:

Philippe Garreau, Paris, FR;

Luc Duchesne, Angervilliers, FR;

Raphaël Laporte, Bois Colombes, FR;

Ludovic Durand, Marcoussis, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 1/04 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 1/073 (2013.01); G01R 1/0408 (2013.01); G01R 29/0821 (2013.01);
Abstract

The invention relates to a device for the electromagnetic testing of an object, comprising a network of electromagnetic probes, a structure for supporting the network of probes and a support for supporting the object being tested. According to the invention, the structure is closed in the three dimensions of space all around the support for the object being tested by at least one conductive wall forming a Faraday cage which is fitted on its inner side by anechoic electromagnetic absorbers located in the intervals between the probes.


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