The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2016
Filed:
Jan. 14, 2015
Applicant:
Massachusetts Institute of Technology, Cambridge, MA (US);
Inventors:
Fei Wang, Stoneham, MA (US);
Timothy M. Swager, Newton, MA (US);
Assignee:
Massachusetts Institute of Technology, Cambridge, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 33/00 (2006.01); G01N 33/48 (2006.01); G01N 27/00 (2006.01); G01N 27/12 (2006.01); B82Y 15/00 (2011.01);
U.S. Cl.
CPC ...
G01N 27/127 (2013.01); G01N 27/126 (2013.01); B82Y 15/00 (2013.01); Y10S 977/742 (2013.01); Y10S 977/957 (2013.01);
Abstract
The present invention generally provides devices, systems, and methods for determination of one or more analytes. The analyte may be determined by monitoring, for example, a change in an electrical, optical, or other signal of a material (e.g., sensor material) present within the device, upon exposure to the analyte. The signal may be an electrical and/or optical property of the device. In some cases, devices described herein may be useful as sensors for the determination of analytes such as explosives, chemical warfare agents, and/or toxins.