The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Aug. 28, 2012
Applicants:

Seon-hong Lee, Yongin-si, KR;

Ho-gon You, Yongin-si, KR;

Joo-han Song, Yongin-si, KR;

In-ho Jung, Yongin-si, KR;

Jake Kim, Yongin-si, KR;

Inventors:

Seon-Hong Lee, Yongin-si, KR;

Ho-Gon You, Yongin-si, KR;

Joo-Han Song, Yongin-si, KR;

In-Ho Jung, Yongin-si, KR;

Jake Kim, Yongin-si, KR;

Assignee:

Samsung SDI Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/36 (2006.01); G01N 23/227 (2006.01); H01J 37/28 (2006.01); H01M 4/13 (2010.01); H01M 10/42 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2273 (2013.01); H01J 37/28 (2013.01); H01M 4/13 (2013.01); H01M 10/42 (2013.01);
Abstract

A device for analyzing a film on a surface of an electrode for a rechargeable lithium battery includes: an inert chamber capable of maintaining an inert atmosphere including controlled amounts of moisture and oxygen and including an inner space for pretreating a sample including the film on the surface of the electrode; a first analyzer coupled to the inert chamber through a connection tube, the first analyzer being configured to receive the sample and being configured to provide composition and thickness information of the film; an inert holder configured to be assembled around the sample in the inert chamber and configured to maintain the inert atmosphere around the sample; and a second analyzer mounted with the inert holder therein and configured to provide shape information of the film. A method of analyzing a film on a surface of an electrode using the device is also disclosed.


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