The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2016
Filed:
Feb. 17, 2010
Christopher Lee Kavars, Elkader, IA (US);
Leslie Davis, Elkader, IA (US);
Christopher Lee Kavars, Elkader, IA (US);
Leslie Davis, Elkader, IA (US);
SENSR MONITORING TECHNOLOGIES LLC, Georgetown, TX (US);
Abstract
A method and system for monitoring the integrity of a structure such as a building or a bridge includes taking accelerometer readings using an accelerometer and taking inclinometer readings using an inclinometer. The accelerometer and inclinometer each take readings in at least one axis, with one coincident axis between the two. The accelerometer readings are preferentially sampled at a higher rate than the inclinometer readings. Accelerometer readings verify inclinometer readings, and vice-versa. Using acceleration readings, it can be determined whether, when, and at what frequency inclination readings should be taken. The inclinometer can be powered down as long as accelerometer readings indicate that the environment would strain the inclinometer. Inclinometer readings can also be modified and corrected using inclinometer readings. Data accuracy and reliability are enhanced, and the overall integrity of a structure is dynamically monitored even as the structure and its environment change over time.