The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Dec. 02, 2013
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

Lovell Elgin Comstock, II, Charlestown, NH (US);

James Dixon Cornell, Rochester, NY (US);

Jeffry John Santman, Westmoreland, NH (US);

Kenneth Smith Woodard, New Boston, NH (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/04 (2006.01); H04N 9/04 (2006.01); H04N 5/347 (2011.01); G01J 3/02 (2006.01); G01J 3/36 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/0208 (2013.01); G01J 3/0229 (2013.01); G01J 3/0256 (2013.01); G01J 3/04 (2013.01); G01J 3/2803 (2013.01); G01J 3/36 (2013.01); H04N 5/347 (2013.01); H04N 9/04 (2013.01); G01J 2003/042 (2013.01); G01J 2003/045 (2013.01); G01J 2003/2813 (2013.01); G01J 2003/2826 (2013.01);
Abstract

A hyperspectral imaging system and a method are described herein for providing a hyperspectral image of an area of a remote object. In one aspect, the hyperspectral imaging system includes a fore optic with optics for acquiring and projecting an image from a remote object, a scannable slit mechanism with a plurality of slits for receiving the projected image, where the projected image simultaneously illuminates two or more of the plurality of slits, a spectrometer for receiving and dispersing images passing through the two or more simultaneously-illuminated slits, and a two-dimensional image sensor for recording images received from the spectrometer, where the images received from different slits are recorded on different sets of detection elements of the two-dimensional image sensor.


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