The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2016
Filed:
Sep. 13, 2011
Santino Crupi, Turin, IT;
Santino Crupi, Turin, IT;
PSC ENGINEERING S.R.L., Turin, IT;
Abstract
A system () is described for determining offsets (δ) of measuring instruments, in particular of measures with a null or constant mean value, composed of first processing means () adapted to compute, from at least one value of a measuring signal (S) deriving from an instantaneous measure performed by at least one measuring instrument or a sensor, at least one offset value (δ) of such signal (S); and second processing means () adapted to subtract such offset value (δ) from the value of the instantaneous measure signal (S) to obtain a corrected measure value (S−δ) of such signal S. A process is also described for determining offsets (δ) of measuring instruments, in particular of measures with a null or constant mean value.