The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Oct. 01, 2013
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Barbara A. Capron, Sammamish, WA (US);

Claudio G. Parazzoli, Seattle, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); H04B 10/70 (2013.01);
U.S. Cl.
CPC ...
G01B 9/02041 (2013.01); G01B 9/02027 (2013.01); G01B 9/02028 (2013.01); H04B 10/70 (2013.01); G01B 2290/45 (2013.01); G01B 2290/55 (2013.01);
Abstract

A system may include a synthetic optical aperture configured to receive a plurality of received photon beams comprising a scene including an object. The system may also include an active optical interference system configured to interfere each of the plurality of received photon beams from the synthetic optical aperture with a corresponding source photon beam of a plurality of source photon beams. The active optical interference system may generate a plurality of enhanced interference beams. Each enhanced interference beam includes at least a predetermined gain. The system may further include a detector system configured to detect the plurality of enhanced interference beams and generate an electrical output signal for use in generating a reconstructed image of the object with improved resolution responsive to at least the predetermined gain of the enhanced interference beams.


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