The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Dec. 05, 2014
Applicant:

At&t Intellectual Property I, L.p., Atlanta, GA (US);

Inventors:

Dan Pei, Jersey City, NJ (US);

Ashley Flavel, Seattle, WA (US);

Zihui Ge, Madison, NJ (US);

Alexandre Gerber, Madison, NJ (US);

Hiren Shah, Morristown, NJ (US);

He Yan, Berkeley Heights, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0823 (2013.01); H04L 41/0618 (2013.01); H04L 41/0677 (2013.01);
Abstract

Example methods disclosed herein to localize anomalies in a communication network include identifying a first set of abnormal nodes in the communication network, and including respective ones of the first set of abnormal nodes having a number of normal direct descendent nodes that is less than a combined number of abnormal direct descendent nodes and indeterminate direct descendent nodes in a set of candidate nodes. Such disclosed example methods also include iteratively selecting ones of the set of candidate nodes to include in a set of root cause abnormal nodes representing sources of the anomalies in the communication network. In such disclosed example methods, the ones of the set of candidate nodes are selected based on sizes of respective subsets of the abnormal nodes from the first set of abnormal nodes covered by the candidate nodes.


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