The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Oct. 18, 2013
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Zhu Ji, San Jose, CA (US);

Johnson O. Sebeni, Fremont, CA (US);

Yu-Lin Wang, Fremont, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 27/06 (2006.01); H04L 27/26 (2006.01); H04L 27/00 (2006.01);
U.S. Cl.
CPC ...
H04L 27/2659 (2013.01); H04L 27/266 (2013.01); H04L 27/2682 (2013.01); H04L 27/2688 (2013.01); H04L 2027/0053 (2013.01);
Abstract

Methods and apparatuses to determine a frequency adjustment in a mobile wireless device are disclosed. A method includes determining a coarse frequency error estimate and multiple fine frequency error estimates; selecting at least one candidate fine frequency error estimate having a frequency value closest to a corresponding frequency value for the coarse frequency error estimate; and determining a frequency adjustment based on a combination of the coarse frequency error estimate and the selected at least one candidate fine frequency error estimate. In an embodiment, the method further includes calculating a confidence metric for the coarse frequency error estimate; when the confidence metric exceeds a threshold value, determining the frequency adjustment based on the candidate fine frequency error estimate; otherwise, determining the frequency adjustment based on a fine frequency error estimate in the plurality of fine frequency error estimates closest to a most recent previous fine frequency error estimate.


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