The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Nov. 14, 2014
Applicant:

Murata Manufacturing Co., Ltd., Nagaokakyo-shi, Kyoto-fu, JP;

Inventors:

Kazuhisa Uchida, Nagaokakyo, JP;

Yoshito Saito, Nagaokakyo, JP;

Jun Ikeda, Nagaokakyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/12 (2006.01); H01G 4/30 (2006.01); H01G 4/012 (2006.01);
U.S. Cl.
CPC ...
H01G 4/1227 (2013.01); H01G 4/1218 (2013.01); H01G 4/30 (2013.01); H01G 4/012 (2013.01);
Abstract

In a multilayer ceramic capacitor, an inner ceramic layer includes a perovskite-type compound containing Ba and Ti. A region within an electrically effective portion of the inner ceramic layers sandwiched between inner electrodes, which is near an area where inner and outer electrodes connect to each other, is subjected to a mapping analysis using EDS. ((L−L)/L)×100≧50 is satisfied, Ldenotes a total length of ceramic grain boundaries detected from a TEM transmission image, Ldenotes a total length of grain boundaries, detected from a mapping image and the TEM transmission image, where the rare earth element is present, and Ldenotes a total length of portions, detected from a mapping image and the TEM transmission image, in which the grain boundaries where the rare earth element is present and grain boundaries where at least one of Mn, Mg, and Si is present are overlapped.


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