The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Mar. 11, 2013
Applicant:

Infinitum Solutions, Inc., Santa Clara, CA (US);

Inventor:

Alexander M. Taratorin, Palo Alto, CA (US);

Assignee:

Infinitum Solutions, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/455 (2006.01); G11B 5/127 (2006.01); G11B 5/02 (2006.01); G11B 5/31 (2006.01);
U.S. Cl.
CPC ...
G11B 5/455 (2013.01); G11B 5/3166 (2013.01); G11B 5/3189 (2013.01);
Abstract

A testing device tests a magnetic head with a read head structure including a read head element while applying an external magnetic field to the magnetic head. The testing device receives signals from the read head element and processes the signals to generate a spectral power density for the signals. The spectral power density is characterized for at least one frequency range. The characterization of the spectral power density is used to determine a characteristic of noise from the read head structure. The signals from the read head may be received with different applied magnetic fields and/or before or while thermally exciting the magnetic head. Additionally, a histogram of the signals may be generated and used to determine a second characteristic of the noise.


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