The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Jul. 14, 2011
Applicants:

Lei Chen, Lawrenceville, NJ (US);

Keelan Evanini, Pennington, NJ (US);

Xie Sun, Florham Park, NJ (US);

Inventors:

Lei Chen, Lawrenceville, NJ (US);

Keelan Evanini, Pennington, NJ (US);

Xie Sun, Florham Park, NJ (US);

Assignee:

Educational Testing Services, Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10L 15/00 (2013.01); G10L 19/06 (2013.01); G10L 21/00 (2013.01); G09B 19/04 (2006.01); G10L 25/60 (2013.01); G09B 19/06 (2006.01); G10L 15/04 (2013.01); G10L 25/27 (2013.01); G10L 25/15 (2013.01);
U.S. Cl.
CPC ...
G09B 19/04 (2013.01); G09B 19/06 (2013.01); G10L 25/60 (2013.01); G10L 15/04 (2013.01); G10L 25/15 (2013.01); G10L 25/27 (2013.01);
Abstract

Computer-implemented systems and methods are provided for assessing non-native speech proficiency. A non-native speech sample is processed to identify a plurality of vowel sound boundaries in the non-native speech sample. Portions of the non-native speech sample are analyzed within the vowel sound boundaries to extract vowel characteristics. The vowel characteristics are used to identify a plurality of vowel space metrics for the non-native speech sample, and the vowel space metrics are used to determine a non-native speech proficiency score for the non-native speech sample.


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