The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Feb. 27, 2012
Applicants:

Nicolaas Hylke Bakker, Eindhoven, NL;

Sandar Hans Denissen, Veldhoven, NL;

Wilhelmus Henrica Gerarda Maria Van Den Boomen, Valkenswaard, NL;

Daniel Simon Anna Ruijters, Eindhoven, NL;

Pieter Maria Mielekamp, Veldhoven, NL;

Inventors:
Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0024 (2013.01); G06T 7/0028 (2013.01); G06T 2207/10121 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30101 (2013.01); G06T 2211/404 (2013.01);
Abstract

2D images are registered with 3D volume data. In order to provide 2D/3D registration with a facilitated workflow 3D volume data () of an object, having a frame of reference is received. A transformation plane () is defined in relation to the 3D volume data. A 2D image of the object with an image plane is received. The transformation plane is projected on the image plane. The frame of reference is aligned with the 2D image. At least one alignment interaction value () is projected () on the transformation plane to determine () at least one transformed interaction value (). The frame of reference is translated with the at least one transformed interaction value.


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