The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Mar. 11, 2013
Applicant:
Nikon Corporation, Tokyo, JP;
Inventor:
Radka Tezaur, Belmont, CA (US);
Assignee:
Nikon Corporation, , JP;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/004 (2013.01); G06T 5/003 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/20048 (2013.01); G06T 2207/20201 (2013.01);
Abstract
A method for deblurring a blurry image () includes utilizing a spatial mask and a variable splitting technique in the latent sharp image estimation cost function. Additionally or alternatively, the method can include the utilizing a spatial mask and a variable splitting technique in the PSF estimation cost function. The spatial mask can be in a regularization term of either or both the latent sharp image estimation cost function and the PSF cost function. The latent sharp image estimation cost function can be used for non-blind deconvolution. Alternatively, one or both cost functions can be used for blind deconvolution.