The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Mar. 05, 2014
Metaio Gmbh, Munich, DE;
Sebastian Lieberknecht, Munich, DE;
Peter Meier, Munich, DE;
Metaio GmbH, Munich, DE;
Abstract
A method for analyzing an image of a real object, generated by at least one camera includes the following steps: generating at least a first image by the camera capturing at least one real object, defining a first search domain comprising multiple data sets of the real object, each of the data sets being indicative of a respective portion of the real object, and analyzing at least one characteristic property of the first image with respect to the first search domain, in order to determine whether the at least one characteristic property corresponds to information of at least a particular one of the data sets of the first search domain. If it is determined that the at least one characteristic property corresponds to information of at least a particular one of the data sets, a second search domain comprising only the particular one of the data sets is defined and the second search domain is used for analyzing the first image and/or at least a second image.