The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Dec. 27, 2012
Applicant:

David Dietrich, Hopedale, MA (US);

Inventor:

David Dietrich, Hopedale, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30563 (2013.01);
Abstract

A data analytic plan is defined for analyzing a given data set associated with a given data problem. A test data set and a training data set are obtained from the given data set associated with the given data problem. At least one model is executed to confirm an adequacy of the at least one model for the data analytic plan by fitting the at least one model on the training data set and evaluating the at least one model fitted on the training data set against the test data set. The defining, obtaining and executing steps are performed on one or more processing elements associated with a computing system and automate at least part of a data analytics lifecycle.


Find Patent Forward Citations

Dietrich, David. (2016). Data analytics lifecycle processes (U.S. Patent No. 9262493). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9262493

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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